Digit Concept will attend the 41^st International Symposium for Testing and Failure Analysis, that will take place in Portland (Oregon, USA)  1-5 November 1-5, 2015.

All the DC Team we will be gald to meet you at our Booth 337  and to show you our last products.

Don't miss our presentation during the session "Sample Preparation and Device Deprocessing II", Thursday, November 5, 2015 at 12:40 PM, titled: LASER combined with Plasma will it be the future green and safe ICs decapsulation method?