IPFA2024 iMIP II XL™
07/16/2024

New for 2024 iMIP II XL™
Atmospheric DCapsulation of IC on Board.
Maximum size 300x300mm (12″x12″)
07/16/2024

New for 2024 iMIP II XL™
Atmospheric DCapsulation of IC on Board.
Maximum size 300x300mm (12″x12″)
04/16/2019 This article describes tests that were carried out by Digit Concept in order to understand and exploit this phe- nomenon. First, new and different methods of decapsula- tion by mixing acids and adjuvants will be reviewed. Next, the article will present a method of end-of-etch detection and how to improve the rinsing process in…
09/14/2017 Digit Concept will attend the 43rd International Symposium for Testing and Failure Analysis, that will take place in Pasadena (California, USA) 5-9 November 1-5, 2017. All the DC Team we will be glad to meet you at our Booth 209 and to show you our last products.
09/01/2017 Welcome at ESREF 2017, we will be please to meet you at our Booth 23.
03/19/2013 Digit Concept Asia will be pleased to introduce our equipment for failure analysis and plasma treatment at SEMICON China 2013. Come and visit us at the booth #2812.